A Low-Power and Area-Efficient Design of a Weighted Pseudorandom Test-Pattern Generator for a Test-Per-Scan Built-in Self-Test Architecture
A test pattern generator generates a pseudorandom test pattern that can be weighted to reduce the fault coverage in a built-in self-test.The objective of this Pots paper is to propose a new weighted TPG for a scan-based BIST architecture.The motivation of this work is to generate efficient weighted patterns for enabling scan chains with reduced pow